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Equipment

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM)

AFM is an imaging technique based on the interaction between the sample and a tiny probe, called the cantilever. The cantilever contains a sharp tip, which is the actual part that will interact with the sample surface. By scanning a sample surface and plotting how these interactions change in function of the x-y position an image can be obtained which plots several physical properties such as e.g ...